Public-source company profile
Cohu
Capabilities
Semiconductor test handlers · interface · inspection and analytics
HBM2.5D / 3DFCBGAPOWER SEMICONDUCTORAUTOMOTIVE / HIGH RELIABILITYCPUs, GPUs, AI accelerators and network processors
Reliability qualification and failure analysisT-Core active thermal control for high-power IC test
CPUs, GPUs and accelerators self-heat rapidly during final test, SLT or burn-in. If DUT junction temperature drifts from setpoint, temperature effects can be mistaken for electrical failure or problems at true operating temperature can be missed.
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