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Public-source company profile

Siemens Digital Industries Software

Capabilities

Electronics cooling · package thermal characterization · thermo-mechanical workflows

HBM2.5D / 3DFCBGACHIPLET / HYBRID BONDINGPOWER SEMICONDUCTORAUTOMOTIVE / HIGH RELIABILITYPackages, modules and electronic systemsIGBT, SiC and GaN power modules and packages3D ICs, chiplets, stacked die and heterogeneous integration

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Related solutions

Reliability qualification and failure analysis

Simcenter Micred Power Tester for power cycling and failure-in-progress monitoring

Tracks gradual degradation of die attach, solder, wire bonds and thermal interfaces as power modules undergo repeated switching and junction-temperature swings, rather than reporting only the final failure time.

Official website ↗

Official materials

E-BOOKTesting the thermal performance of electronics ↗TECHNICAL PAPERNondestructive power-cycling test method for IGBTs ↗

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Related questions

Thermo-mechanical simulation and lifetime prediction

In a Simcenter 3D coupled thermal-structural package model, which PCB, cooling and assembly-history boundary conditions are needed to avoid underestimating warpage?

Reliability qualification and failure analysis

During power cycling with the Simcenter Micred Power Tester, how should thermal impedance, temperature-sensitive parameters and failure criteria be configured to distinguish die-attach degradation, interconnect fatigue and thermal-path changes driven by package or interface stress?

OFFICIAL SUPPLIER ANSWERS

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