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Should the power substrate change its ceramic, thickness or copper layers?

Expected deliverable: Material/thickness/copper-layer candidates and representative-specimen validation

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You can add conditions one at a time. Each answer updates preparation guidance for the current task. Selections are temporarily saved in this browser tab for comparison and download.

Prepare first: Is the following available: Die-attach/TIM thickness and contact conditions?

Next missing input: Is the following available: Die-attach/TIM thickness and contact conditions?

This guidance helps prepare the evaluation. Confirm solution and sample applicability individually.

Candidate solutions for this task

2 candidates · Compare up to three
Tong Hsing

AMB silicon-nitride/thick-copper substrate route

The official AMB page describes substrates made from silicon-nitride ceramic and thick copper for high-power modules.

Required inputs, limitations and sources

Required inputs
Ceramic/copper thicknesses, thermophysical properties and temperature dependence;Actual heat-source area, location and power;Die-attach/TIM thickness and contact conditions;Cooling boundaries, temperature-sensor calibration and known-good controls

Main limitations
Specify layer thicknesses, copper patterns, brazed interfaces, insulation and thermomechanical limits. Engineering project acceptance requires a separate inquiry.;This describes product uses and material structures. It does not establish the initial thermal-resistance bottleneck or improvement for this sample. Confirm actual thicknesses, bonds, thermal boundaries and engineering batch quantities.

Tong Hsing · View source ↗
Official technical summary reviewed · This describes product uses and material structures. It does not establish the initial thermal-resistance bottleneck or improvement for this sample. Confirm actual thicknesses, bonds, thermal boundaries and engineering batch quantities.

CeramTec

AlN ceramic material/substrate route

The official information lists AlN substrate thermal properties, insulation and power-module applications.

Required inputs, limitations and sources

Required inputs
Ceramic/copper thicknesses, thermophysical properties and temperature dependence;Actual heat-source area, location and power;Die-attach/TIM thickness and contact conditions;Cooling boundaries, temperature-sensor calibration and known-good controls

Main limitations
Confirm ceramic grade, metallization, dimensions and actual thermophysical data. Bulk k is not assembled Rth.;Material conductivity data do not establish assembled Rth. Specify ceramic grade, temperature dependence, metallization, thickness, interfaces and cooling boundaries.

CeramTec · View source ↗
Official technical summary reviewed · Material conductivity data do not establish assembled Rth. Specify ceramic grade, temperature dependence, metallization, thickness, interfaces and cooling boundaries.

What expertise does this task need?

Ceramic-material and metallization-process specialist

Deliverables to discuss: Material/thickness/copper-layer candidates and representative-specimen validation

No public independent-expert profile currently matches this task. Prepare the engagement scope or ask candidate suppliers for the technical specialist responsible for this work.

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Check scope and related problems

How can ceramic through-thickness conduction, copper spreading and contact-interface contributions be separated before comparing ceramic types, thicknesses and metallization stacks?

In scope: Material and stack decisions for initial thermal paths in ceramic/metallized substrates

Other situations: Improving already-localized die-attach voids, TIM contact or pump-out;Root causes of whole-module Rth drift after active power cycling;General PCB electrical behavior, RF loss or new test-screening problems

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Additional supplier candidates · 6

Potential uses from public research. These entries are outside the condition-based assessment; confirm sample, specification and service requirements.

Research candidate · suitability unconfirmed

Silicon-nitride AMB copper substrates

Tong Hsing

Compare the initial path through ceramic, metallization and layer thicknesses.

Sources and limits

Use the actual metallized stack, contacts and normalized tests; bare-ceramic conductivity is not substrate thermal resistance.

Official public page; sample suitability remains unconfirmed.

Research checked: 2026-10-15

Sources and limits ↗
Solution details →
Research candidate · suitability unconfirmed

AlN substrates with metallization options

MARUWA

Compare the initial path through ceramic, metallization and layer thicknesses.

Sources and limits

Use the actual metallized stack, contacts and normalized tests; bare-ceramic conductivity is not substrate thermal resistance.

Official search index; confirm the full page and specifications.

Research checked: 2026-10-15

Sources and limits ↗
Solution details →
Research candidate · suitability unconfirmed

Alunit AlN HP substrates

CeramTec

Compare the initial path through ceramic, metallization and layer thicknesses.

Sources and limits

Use the actual metallized stack, contacts and normalized tests; bare-ceramic conductivity is not substrate thermal resistance.

Official search index; confirm the full page and specifications.

Research checked: 2026-10-15

Sources and limits ↗
Solution details →