HZ-15 E/H near-field probes

Rohde & Schwarz · EMI measurement

Purpose: Local near-field scans can identify relatively strong signals and relevant frequencies around suspected package/board coupling.
Technical approach: Passive HZ-15 E- and H-field probes scan accessible boards, modules and conductors with a spectrum analyzer or compatible instrument.
Scope of use: EMI debugging within the stated frequency range, with controlled probe geometry and device operating conditions.
Limitations and open questions: These evaluation considerations are compiled by BLNKK from public information. They are not supplier guarantees or a mandatory submission checklist.
Scope and limitations
Manual near-field signals are not regulatory radiated-emission levels or guaranteed buried-die localization. HZ-16 is optional; the application-card analyzer is an example pairing.
What to prepare
BLNKK suggests recording suspect frequencies, operating modes and accessible areas, with fixed scan geometry/gain and background/operating comparisons.
Confirm with the supplier
Confirm probes, receiver and amplifier configuration, and how sensitivity, background interference and scan repeatability affect interpretation.
Public evidence: The product page lists probe configurations; the June 2016 application card illustrates board/module scans and background versus operating traces.

Supporting references

Find the company’s contact details and ask about this solution through its official channels.