TESTLINE die-level electro-optical baselines

ficonTEC · Process equipment and thermal control

Purpose: Comparing source/PIC output or drift requires a repeatable electro-optical baseline.
Technical approach: TESTLINE automates die-level DC/RF/optical tests including LIV, spectra and near/far fields; facet inspection is configurable.
Scope of use: The stated scope covers singulated active/passive PICs, laser dies and chip-on-submount sources; confirm device-specific fixtures.
Limitations and open questions: These evaluation considerations are compiled by BLNKK from public information. They are not supplier guarantees or a mandatory submission checklist.
Scope and limitations
A controlled chuck is not a complete thermal-cycling system or automatic separation of source, coupling and mechanical drift. Measurements depend on configuration.
What to prepare
BLNKK suggests documenting devices, bias, coupling fixtures and calibration, with synchronized temperature, time and spectral/power records for repeatability comparisons.
Confirm with the supplier
Confirm instruments, test programs, optional facet inspection, chuck/device-temperature measurement and fixture/coupling support for CPO samples.
Public evidence: The named page and four-page brochure document tests, modular configurations and a temperature-controlled chuck.

Supporting references

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