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Chroma ATE

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Public capability summary

  • Power semiconductor test · burn-in · reliability and automated test
Reliability validation and failure analysisMeasurement, inspection and failure localization

Applications: High-power IC packages · Accessible RDL-via/chain test structures · Decoupling capacitors / power inductors

Catalog solutions · 3

Reliability qualification and failure analysis

3210-A / 3200 high-power package SLT

Validates functional behavior, contacts and thermal management of large high-power ICs in SLT before comparing engineering and production conditions.

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