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MA-tek

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Public capability summary

  • Semiconductor materials analysis · failure analysis · reliability
Reliability validation and failure analysisMeasurement, inspection and failure localizationMaterial properties and interface design

Applications: Package interfaces / internal defects / pre- and post-reflow or reliability-test analysis · Assembled board specimens · Ball-placement/rework specimens · Representative uncured dispersions · References/water-soluble residue extracts

Catalog solutions · 5

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