Find solutions / Suppliers & solutions / MA-tek Public capability summary Semiconductor materials analysis · failure analysis · reliability Reliability validation and failure analysis Measurement, inspection and failure localization Material properties and interface design
Applications: Package interfaces / internal defects / pre- and post-reflow or reliability-test analysis · Assembled board specimens · Ball-placement/rework specimens · Representative uncured dispersions · References/water-soluble residue extracts
Catalog solutions · 5 Reliability qualification and failure analysis Delamination, cracks, voids or electrical changes after reflow, thermal cycling or service require defect localization before structural or material changes can be linked to the failure.
Reliability qualification and failure analysis Pad-cratering review needs board bending and support correlated with electrical failure timing.
Engineering measurement and characterization Coplanarity comparisons need traceable ball-placement specimens and process history.
Engineering measurement and characterization Underfill comparisons need dispersion-size and aggregation evidence before cure.
Engineering measurement and characterization Cleaning-residue comparisons must distinguish extractable organics from their original surface distribution.
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