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SUMILITE LαZ low-CTE package-substrate materials

Sumitomo Bakelite · Material properties and interface engineering

Purpose
Package-warpage comparisons must assess substrate materials with the actual stack, copper layout and temperature history.
Technical approach
LαZ low-expansion, high-modulus laminates/prepreg use resin and filler design to tune substrate thermomechanical behavior.
Scope of use
Organic IC-substrate material/stack redesign with confirmed grades, electrical requirements and fabrication processes.
Limitations and open questions

These evaluation considerations are compiled by BLNKK from public information. They are not supplier guarantees or a mandatory submission checklist.

Scope and limitations

Low CTE/high modulus alone cannot guarantee low finished-package warpage or predict reversal. Grade-specific electrical and fabrication windows need separate validation.

What to prepare

BLNKK suggests documenting stacks, thicknesses, copper distribution, cure/reflow histories and temperature-dependent properties, checking comparative models against measured warpage.

Confirm with the supplier

Confirm grade data, directions/test conditions, stack/fabrication compatibility and representative package-warpage/reliability evidence.

Public evidence
The official family page lists laminates/prepreg and associates low CTE/high modulus with package-warpage improvement; evidence is qualitative at family level.

Contact the supplier

Find the company’s contact details and ask about this solution through its official channels.

Related engineering problems

These links use established solution relationships. Continue to engineering conditions and evaluation preparation.

BLNKK organizes information from public sources. A company profile does not imply a documented solution. Applicability still needs confirmation against your samples and engineering conditions.