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SR7300 / SR-F low-CTE, low-shrinkage solder resist for package substrates

Resonac · Material properties and interface engineering

Purpose
Package-substrate solder resist can contribute to cure shrinkage, thermal expansion and warpage alongside stack-up and copper distribution.
Technical approach
SR7300 is liquid and SR-F is film photosensitive solder resist. Resonac positions their low-CTE, low-shrinkage formulations for package substrates.
Scope of use
Relevant to package substrates requiring solder-mask openings and reflow or thermal-cycle reliability. Confirm the grade, thickness and process for the actual stack.
Limitations and open questions

These evaluation considerations are compiled by BLNKK from public information. They are not supplier guarantees or a mandatory submission checklist.

Scope and limitations

Series data and comparisons do not guarantee every grade/customer substrate achieves the same warpage or durability.

What to prepare

BLNKK suggests preparing stack-up, copper distribution, mask thickness and openings, exposure, development and cure conditions, plus warpage and reliability targets.

Confirm with the supplier

Confirm grades/thicknesses, property methods, processing windows and the specimens, thermal profiles and criteria behind published tests.

Public evidence
The supplier’s series table lists Tg of 130–140°C, α1 CTE of 38 ppm/°C and modulus of 5,000 MPa at 23°C, with continuity and acoustic comparisons through 3,000 thermal cycles. Complete specimen and cycling conditions are undisclosed; these are not customer-substrate guarantees.

Contact the supplier

Find the company’s contact details and ask about this solution through its official channels.

Related engineering problems

These links use established solution relationships. Continue to engineering conditions and evaluation preparation.

BLNKK organizes information from public sources. A company profile does not imply a documented solution. Applicability still needs confirmation against your samples and engineering conditions.