MCL-E-770G Type R/RLH low-warpage package substrate material
Targets package warpage in FC-CSP, PoP and SiP substrates driven by CTE mismatch and insufficient stiffness.
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View contact information ↓Applications: FC-CSP, PoP and SiP substrates · Flip-chip and high-density package substrates · Thin-wafer dicing and die attachment · FCBGA dispense/fillet evaluation · Organic-substrate encapsulant/interface evaluation
Targets package warpage in FC-CSP, PoP and SiP substrates driven by CTE mismatch and insufficient stiffness.
Package-substrate solder resist can contribute to cure shrinkage, thermal expansion and warpage alongside stack-up and copper distribution.
Thin-wafer dicing and pickup need stable handling and assessment of die-attach film contact.
FCBGA fillet assessment needs material/dispensing comparisons that consider gap filling and keep-out areas.
Moisture/reflow delamination comparisons need both encapsulant and actual-interface evidence.
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The Taiwan company lists semiconductor CMP polishing materials and photosensitive dry film for printed wiring boards. For other packaging materials, use the Asia Pacific general inquiry form and specify the product to confirm the responsible contact. Official source ↗
Taiwan · Supplier office
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Singapore · Supplier office
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