JIB-PS500i site-specific FIB sampling
JEOL · Engineering metrology and failure analysis
- Purpose
- Prepare local sections/lamellae from prelocalized suspected open contacts for interface investigation.
- Technical approach
- JIB-PS500i combines Ga FIB milling with SEM preparation monitoring; lift-out/automation depend on options.
- Scope of use
- Evaluate mountable chamber-compatible samples with target contacts independently localized and original evidence preserved.
- Limitations and open questions
These evaluation considerations are compiled by BLNKK from public information. They are not supplier guarantees or a mandatory submission checklist.
Scope and limitationsDestructive local preparation can introduce ion damage/redeposition. A lamella neither proves the open's cause nor represents every contact.
What to prepareBLNKK suggests preparing electrical coordinates, layers/metals, section direction, prior images and controls, planning protection and sampling.
Confirm with the supplierConfirm mounting, sampling/transfer options, ion-damage control and downstream TEM/EDS or other analysis responsibilities/configurations.
- Public evidence
- The named page documents FIB/SEM and preparation functions, distinguishing sampling/automation/EDS options.
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BLNKK organizes information from public sources. A company profile does not imply a documented solution. Applicability still needs confirmation against your samples and engineering conditions.