EAG TOF-SIMS residue-species service

Eurofins EAG Laboratories · Engineering measurement and characterization

Purpose: Identify molecular and elemental signals in debonded surface residues against possible material sources.
Technical approach: Pulsed primary ions generate secondary-ion spectra and surface maps; depth profiling additionally uses ion sputtering.
Scope of use: Documented for organic/inorganic and conducting/insulating surfaces; confirm vacuum compatibility and sample condition.
Limitations and open questions: These evaluation considerations are compiled by BLNKK from public information. They are not supplier guarantees or a mandatory submission checklist.
Scope and limitations
Matrix effects prevent direct conversion of intensity to concentration. Low-dose static analysis differs from sputter profiling; neither establishes cleaning compatibility.
What to prepare
BLNKK suggests retaining original surfaces and handling records, with matched-substrate controls and known bonding/debonding material references.
Confirm with the supplier
Confirm handling, analysis mode, references/calibration and deliverable spectra, maps and interpretation.
Public evidence: EAG's service page and three-page note revised in 2022 describe capabilities, matrix effects and quantitation limits.

Supporting references

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