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EAG Auger seed/barrier residue analysis

Eurofins EAG Laboratories · Engineering measurement and characterization

Purpose
Compare elements at abnormal RDL line-gap locations when investigating suspected seed/barrier residues.
Technical approach
Electron-excited Auger analysis examines exposed features, with elemental maps, linescans or sputter depth profiles.
Scope of use
Suitable for located surfaces or prepared cross-sections; assess insulators, charging and vacuum compatibility.
Limitations and open questions

These evaluation considerations are compiled by BLNKK from public information. They are not supplier guarantees or a mandatory submission checklist.

Scope and limitations

Chemical-state information is limited and insulators are difficult. Buried regions need preparation; detected metal alone does not prove a conductive bridge.

What to prepare

BLNKK suggests preparing shorted-net coordinates, images, stack/process records, matched controls and preparation history.

Confirm with the supplier

Confirm accessible targets, charging/sputtering treatment, quantitative references and correlation with electrical results.

Public evidence
EAG documents small-area, bond-pad and cross-section analysis, including semi-quantitative methods and limitations.

Contact the supplier

Find the company’s contact details and ask about this solution through its official channels.

Related engineering problems

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BLNKK organizes information from public sources. A company profile does not imply a documented solution. Applicability still needs confirmation against your samples and engineering conditions.