NEX CG II multilayer metal-film analysis
Rigaku · Packaging processes and engineering validation
- Purpose
- Contact- or seed-layer process comparisons need film-thickness and elemental-composition data alongside other evidence.
- Technical approach
- NEX CG II uses indirect-excitation EDXRF, with fundamental-parameters software and stack modelling for film analysis.
- Scope of use
- Consider it for multilayer films and process coupons with suitable models, references and equipment configuration.
- Limitations and open questions
These evaluation considerations are compiled by BLNKK from public information. They are not supplier guarantees or a mandatory submission checklist.
Scope and limitationsSpot-averaged film data do not directly establish via-wall continuity, local oxidation states or electrical contact quality.
What to prepareBLNKK suggests preparing the layer sequence, materials and estimated thicknesses, coupon dimensions and reference samples, with comparison locations.
Confirm with the supplierConfirm the model, spot size, calibration/reference method and sample-specific measurement uncertainty.
- Public evidence
- Official pages describe multilayer films and distinguish standardless semi-quantitative analysis from quantitative analysis using standards.
Supporting references
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Related engineering problems
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BLNKK organizes information from public sources. A company profile does not imply a documented solution. Applicability still needs confirmation against your samples and engineering conditions.