SmartLab SE XRD analysis of thin-film residual stress and texture
Metal films can retain deposition/cooldown stress; lattice strain and texture data complement visible shape measurements.
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View contact information ↓Applications: RDL, UBM, metallization and coatings · Substrate copper interconnect coupons · Metal films / process coupons · Resin / mold-compound coupons
Metal films can retain deposition/cooldown stress; lattice strain and texture data complement visible shape measurements.
Copper-fill voids can occur at different substrate depths; 3D imaging complements individual cross-sections.
Contact- or seed-layer process comparisons need film-thickness and elemental-composition data alongside other evidence.
Drying comparisons need separate observations of mass change and thermal reactions.
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