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DMA/TMA packaging-material characterization

Element Materials Technology · Measurement and inspection

Research candidate · suitability unconfirmed

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Research checked: 2026-10-15
Purpose
Potential engineering use: [Cooling-stage warpage reversal in large 2.5D FCBGA] Compare material, stack and thermal-history effects on cooling curvature. [RDL film/cure-induced curvature increment] Assess film and cure-material contributions to curvature increments.
Technical approach
Detailed mechanism and process conditions are not documented here. Confirm with the supplier.
Scope of use
Potential engineering use: [Cooling-stage warpage reversal in large 2.5D FCBGA] Compare material, stack and thermal-history effects on cooling curvature. [RDL film/cure-induced curvature increment] Assess film and cure-material contributions to curvature increments.
Limitations and open questions
[Cooling-stage warpage reversal in large 2.5D FCBGA] Require heating/cooling data, cure shrinkage and viscoelastic properties; room-temperature flatness does not establish reversal behavior. [RDL film/cure-induced curvature increment] Require pre/post-film curvature, thickness and properties; indentation modulus is not residual-stress measurement. Supplier confirmation of samples, specifications and service availability is required; improvement has not been demonstrated.
Public evidence
The official source lists DMA/TMA packaging-material characterization.
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Supporting references

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Potential uses by engineering problem

Warpage reversal during cooling in large 2.5D FCBGA packages

Compare material, stack and thermal-history effects on cooling curvature.

Require heating/cooling data, cure shrinkage and viscoelastic properties; room-temperature flatness does not establish reversal behavior.

View engineering problem →
Which RDL layer is making the wafer bend more?

Assess film and cure-material contributions to curvature increments.

Require pre/post-film curvature, thickness and properties; indentation modulus is not residual-stress measurement.

View engineering problem →

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