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Interposer PoP low-warpage dual-substrate stacked package

Amkor Technology · Package architecture and warpage compensation

Purpose
Integrates logic, memory and other devices in a compact stack while addressing interconnects and package-unit warpage.
Technical approach
EMC surrounds the die between a bottom substrate and top interposer connected with copper-core balls. Die attachment can use TCNCP or reflow with CUF, while the interposer supports memory, passives and other top-side configurations.
Scope of use
The platform addresses logic-memory PoP integration, with mobile products among documented applications. Common dimensions, die thicknesses and reference stacks are not universal design limits; I/O, dimensions and material configurations require design-specific confirmation.
Limitations and open questions

These evaluation considerations are compiled by BLNKK from public information. They are not supplier guarantees or a mandatory submission checklist.

Scope and limitations

Supplier-stated low unit warpage does not demonstrate suppression of thermal warpage reversal. Reference stacks do not qualify every design.

What to prepare

BLNKK suggests die/substrate/interposer geometry and materials, thermal history, top-device configuration and measured warpage.

Confirm with the supplier

Confirm stack-specific design rules, materials, temperature-dependent warpage and reliability evidence, current specifications and trial options.

Public evidence
Amkor’s page and February 2022 datasheet describe the dual-substrate architecture, CCB connections, volume experience and reference stack-ups.

Supporting references

Contact the supplier

Find the company’s contact details and ask about this solution through its official channels.

Related engineering problems

These links use established solution relationships. Continue to engineering conditions and evaluation preparation.

BLNKK organizes information from public sources. A company profile does not imply a documented solution. Applicability still needs confirmation against your samples and engineering conditions.