S-SWIFT organic RDL fan-out-on-substrate heterogeneous integration
Multi-die and memory integration needs dense, short die-to-die connections while balancing package size, electrical performance, cost and thermomechanical behavior.
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View contact information ↓Applications: AI/HPC, networking, multi-die and memory · Mobile/client logic-memory and stacked packages · Power MOSFETs and TOLL · BGA controlled cycling and failure analysis · Die-to-die package-path electrical correlation
Multi-die and memory integration needs dense, short die-to-die connections while balancing package size, electrical performance, cost and thermomechanical behavior.
Integrates logic, memory and other devices in a compact stack while addressing interconnects and package-unit warpage.
Power devices need interconnect comparisons against electrical, thermal and package-outline requirements.
Compare BGA board-level cycling damage using traceable test and failure-analysis evidence.
Package models and electrical measurements can help assess package-path contributions to chiplet signal-margin problems and power integrity.
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