AMPS high-power parallel burn-in
Accelerated electrical-stress testing of high-power packages requires control of device power and temperature. AMPS-BI provides the AMPS platform’s parallel burn-in capability for evaluating screening flows.
AEM Holdings
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- System-level test · test handlers · semiconductor test solutions
Applications: High-power semiconductor packages
Catalog solutions · 1
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Singapore · Headquarters
AEM Holdings Ltd. / AEM Singapore Pte. Ltd.
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- +65 6483 1811
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