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Research candidate · suitability unconfirmed

Unclaimed company profile based on public research. Supplier endorsement and project-level performance are unconfirmed.

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Catalog solutions · 2

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Measurement and inspection

Horus A die-shift metrology

Potential engineering use: [Molding-induced fan-out die shift and RDL misalignment] Correlate die coordinates before and after molding.

Research candidate · suitability unconfirmed

Official search index; confirm the full page and specifications.

Research checked: 2026-10-15

Potential uses by engineering problem

Post-mold die shift and RDL misalignment in fan-out packages

Correlate die coordinates before and after molding.

Placement accuracy is not post-mold shift; retain matched coordinates and process history.

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Measurement and inspection

FOPLP RDL fine-line AOI

Potential engineering use: [As-fabricated RDL shorts] Inspect initial shorts associated with lithography, metal lines and etch residues.

Research candidate · suitability unconfirmed

Official search index; confirm the full page and specifications.

Research checked: 2026-10-15

Potential uses by engineering problem

RDL line-to-line shorts after fabrication

Inspect initial shorts associated with lithography, metal lines and etch residues.

AOI may miss buried shorts; correlate electrical results and defect coordinates.

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