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GPM

Explore the supplier’s public information and its documented technical solutions.

Research candidate · suitability unconfirmed

Unclaimed company profile based on public research. Supplier endorsement and project-level performance are unconfirmed.

Official solution videos

Awaiting an official submission

Catalog solutions · 3

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Measurement and inspection

Auto Scan White Light Interferometer

Potential engineering use: [Microbump height variation and coplanarity] Compare bump fabrication or 3D height data.

Research candidate · suitability unconfirmed

Official search index; confirm the full page and specifications.

Research checked: 2026-10-15

Potential uses by engineering problem

Microbump height variation and coplanarity

Compare bump fabrication or 3D height data.

Verify pitch, reflectivity, reference plane and repeatability; fabrication does not establish coplanarity compliance.

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Measurement and inspection

Wafer 2D AOI

Potential engineering use: [As-fabricated RDL shorts] Inspect initial shorts associated with lithography, metal lines and etch residues.

Research candidate · suitability unconfirmed

Official search index; confirm the full page and specifications.

Research checked: 2026-10-15

Potential uses by engineering problem

RDL line-to-line shorts after fabrication

Inspect initial shorts associated with lithography, metal lines and etch residues.

AOI may miss buried shorts; correlate electrical results and defect coordinates.

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Measurement and inspection

3D NIR post-dicing crack inspection

Potential engineering use: [Ultrathin-wafer grinding, handling and debond damage] Compare carrier support, thinning, handling and debonding windows.

Research candidate · suitability unconfirmed

Official search index; confirm the full page and specifications.

Research checked: 2026-10-15

Potential uses by engineering problem

Edge chipping and cracking after ultrathin-wafer grinding, handling or debonding

Compare carrier support, thinning, handling and debonding windows.

Confirm thickness, size, adhesive and first damage stage; die bonders address only their handling step.

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BLNKK organizes information from public sources. A company profile does not imply a documented solution. Applicability still needs confirmation against your samples and engineering conditions.