ASAP-1 IPS local decapsulation and thinning
After electrical localization, a microbump anomaly may need exposure for physical examination.
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View contact information ↓Other names: ULTRA TEC · Ultra Tec
Applications: Local semiconductor-package physical analysis · Bare-fiber end faces and optical coupling trials
After electrical localization, a microbump anomaly may need exposure for physical examination.
Fiber-attachment loss comparison needs end geometry separated from coupling and fixing conditions.
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Use the general inquiry form for electronic failure analysis, decapsulation and sample-preparation equipment, specifying the product, application and location. The supplier asks users to request local representative details through the form; the verified US headquarters contact is listed here. Official source ↗
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