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Current problemCracking and intermittent opens in fine-line RDL after thermal cycling
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Cracking and intermittent opens in fine-line RDL after thermal cycling

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2 priority paths12 candidate solutions12 sources

BLNKK's current understanding

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Package architecture
Fan-out / multilayer fine-line RDL; line widths, dielectrics, and via stackup unconfirmed
Observation
Resistance rise, intermittent opens, or suspected routing cracks during or after thermal cycling
Evaluation stage
Temperature-cycle reliability, fault localization, and stackup tracing
Variables to validate
RDL layers, bends / vias, material thermomechanical properties, substrate, and package boundaries
Missing information
In-cycle electrical data, failure locations, actual stackup, material curves, and good-sample controls
Next: confirm engineering conditionsUse 3 key conditions to adjust the assessment order, then choose solutions to compare.
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