kSA MOS ThermalScan temperature-dependent wafer curvature and film-stress metrology
Annealing and thermal cycling change wafer curvature, bow and film stress. Temperature-dependent data support process comparisons and material-model calibration.
k-Space Associates
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- kSA MOS ThermalScan temperature-dependent wafer curvature and film-stress metrology · Warpage, topography and stress metrology
- kSA BandiT wafer-process temperature comparison · Engineering measurement and characterization
Applications: Wafers, thin films and annealing · Optically accessible process wafers
Catalog solutions · 2
kSA BandiT wafer-process temperature comparison
TSV stress-model thermal histories need actual process-wafer temperature references.
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The manufacturer lists Japan-based R-DEC as its distributor for Taiwan; this is not a Taiwan office. Use the requestinfo mailbox for general product inquiries. The Request Support form primarily handles existing-system support. Official source ↗
United States · Headquarters · Sales inquiries
k-Space Associates, Inc. — General Product Inquiries
- Phone
- +1 734 426 7977
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Mainland China · Supplier-listed distributor · Sales inquiries
GiantForce Technology Co., Ltd. — China Distributor
- info@giantforce.cn
- Phone
- +86 10 5734 8010
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United States · Supplier office · Sales inquiries
k-Space Associates, Inc. — Pricing and Technical Sales Questions
- sales@k-space.com
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More regional contacts (1)
Japan · Supplier-listed distributor · Sales inquiries
R-DEC Co., Ltd. — Distributor for Japan, Hong Kong and Taiwan
- info@rdec.co.jp
- Phone
- +81 29 858 0211
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