DAGE 4600 automated bond-strength testing
Measures mechanical strength and failure modes of wire, bump, die and surface-mount bonds, with automation supporting consistent, traceable batch data.
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View contact information ↓Other names: Nordson TEST & INSPECTION
Applications: Wafer-level interconnect, BGA, substrates and advanced packages · 2.5D/3D IC, fan-out and power packages · Local BGA joint / pad / substrate comparisons · Package metal contacts · Visible package / contact surfaces
Measures mechanical strength and failure modes of wire, bump, die and surface-mount bonds, with automation supporting consistent, traceable batch data.
Inspect internal delamination, cracks, voids and bond anomalies to guide further package analysis.
Brittle joints and pad/substrate failures need comparison under controlled high-speed shear.
X-ray imaging can locate internal metal geometry that needs further investigation when solder bridging is suspected.
Comparing visible terminal height and package coplanarity requires a consistent reference plane and repeatable optical measurements.
These candidates are already documented in the engineering problem workflow. Review their conditions, sources and comparison details.
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The listed regional contacts handle Bondtest sales. For acoustic, X-ray or optical inspection products, select the appropriate product line in the official inquiry form. Official source ↗
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